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IEC 60749-41 Ed. 1.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
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IEC 60749-41 Ed. 1.0 b:2020

Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

PUBLISH DATE 2020
PAGES 38
IEC 60749-41 Ed. 1.0 b:2020

Semiconductor devices - Mechanical and climatic test methods

Part 41: Standard reliability testing methods of non-volatile memory devices

IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification.

Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60749
Publication Date July 1, 2020
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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