IEC 60749-8 Ed. 1.0 b:2002

Current Revision
Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

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Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

PUBLISH DATE 2002
PAGES 40

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices.

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