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IEC 60759 Ed. 1.0 b:1983

Standard test procedures for semiconductor X-ray energy spectrometers
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IEC 60759 Ed. 1.0 b:1983

Standard test procedures for semiconductor X-ray energy spectrometers

PUBLISH DATE 1983
IEC 60759 Ed. 1.0 b:1983

Standard test procedures for semiconductor X-ray energy spectrometers are essential to ensure accurate performance and reliability.

These procedures typically include calibration, resolution measurement, and stability assessment.

Calibration involves using known X-ray sources to verify the energy scale accuracy of the spectrometer.

Resolution measurement assesses the device's ability to distinguish between closely spaced energy peaks.

Stability tests monitor the spectrometer's performance over time under varying environmental conditions.

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

SDO IEC: International Electrotechnical Commission
Document Number IEC 60759
Publication Date Jan. 1, 1983
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 45
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