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IEC 61000-4-29 Ed. 1.0 b:2000

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
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IEC 61000-4-29 Ed. 1.0 b:2000

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

PUBLISH DATE 2000
PAGES 44
IEC 61000-4-29 Ed. 1.0 b:2000

Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports.

This standard defines:

  • the range of test levels;
  • the test generator;
  • the test set-up;
  • the test procedure.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61000
Publication Date Aug. 1, 2000
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 77A
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