Logo
Login Sign Up
Current Revision

IEC 61164 Ed. 2.0 b:2004

Reliability growth - Statistical test and estimation methods
Best Price Guarantee
Instant

$423.50

2-5 Days

$423.50

SAVE 10%

$762.30


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC 61164 Ed. 2.0 b:2004

Reliability growth - Statistical test and estimation methods

PUBLISH DATE 2004
PAGES 62
IEC 61164 Ed. 2.0 b:2004

Reliability growth refers to the process of improving the reliability of a system or product over time through design changes and testing.

Statistical test methods are employed to evaluate the reliability data collected during the growth testing phases. These methods help in determining if the reliability improvements are statistically significant.

Estimation methods are used to quantify the reliability growth by fitting appropriate models to the failure data. These models provide estimates of reliability parameters that guide further development and decision-making.

IEC 61164:2004 gives models and numerical methods for reliability growth assessments based on failure data, which were generated in a reliability improvement programme.

These procedures deal with growth, estimation, confidence intervals for product reliability and goodness-of-fit tests.

The main changes with respect to the previous edition are:

  • addition of two statistical models for reliability growth planning and tracking in the product design phase;
  • statistical methods for the reliability growth programme in the design phase of IEC 61014;
  • addition of the discrete reliability growth model for the test phase;
  • addition of the fixed number of faults model for the test phase, clarification of the symbols used for various models;
  • addition of real life examples for most of the statistical models;
  • numerical correction of tables in the reliability growth test example.

This standard should be used in conjunction with IEC 61014.

SDO IEC: International Electrotechnical Commission
Document Number IEC 61164
Publication Date March 1, 2004
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 56
Loading...

Failed to load document history.

Publish Date Document Id Type View