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IEC 61169-1-5 Ed. 1.0 b:2022

Radio frequency connectors - Part 1-5: Electrical test methods - Rise time degradation
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IEC 61169-1-5 Ed. 1.0 b:2022

Radio frequency connectors - Part 1-5: Electrical test methods - Rise time degradation

PUBLISH DATE 2022
PAGES 28
IEC 61169-1-5 Ed. 1.0 b:2022
Radio frequency connectors - Part 1-5: Electrical test methods - Rise time degradation
IEC 61169-1-5:2022 provides test methods for the rise time degradation of radio frequency (RF) connector.
This document is applicable to triaxial and other radio frequency connectors.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61169
Publication Date Feb. 1, 2022
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 46F
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