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IEC 61445 Ed. 1.0 en:2012

Digital Test Interchange Format (DTIF)
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IEC 61445 Ed. 1.0 en:2012

Digital Test Interchange Format (DTIF)

PUBLISH DATE 2012
PAGES 112
IEC 61445 Ed. 1.0 en:2012

Digital Test Interchange Format (DTIF)

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies.

This information can be broadly grouped into data that defines the following:

  • a) UUT Model;
  • b) Stimulus and Response;
  • c) Fault Dictionary;
  • d) Probe.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61445
Publication Date June 21, 2012
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 91
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