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IEC 61580-9 Ed. 1.0 b:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
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IEC 61580-9 Ed. 1.0 b:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces

PUBLISH DATE 1996
IEC 61580-9 Ed. 1.0 b:1996

Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces.

Gives the means for determining the reflection coefficient at the junction of two similar rectangular waveguides due to:

  • differences in the waveguide internal dimensions,
  • lateral displacement between the waveguide axes in either the H or E plane,
  • and angular misalignment between the waveguide axes.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61580
Publication Date June 1, 1996
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 46F
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