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IEC 61649 Ed. 2.0 b:2008

Weibull analysis
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IEC 61649 Ed. 2.0 b:2008

Weibull analysis

PUBLISH DATE 2008
PAGES 142
IEC 61649 Ed. 2.0 b:2008
Weibull analysis
IEC 61649:2008 provides methods for analysing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is applicable whenever data on strength parameters, e.g. times to failure, cycles, stress, etc. are available for a random sample of items operating under test conditions or in-service, for the purpose of estimating measures of reliability performance of the population from which these items were drawn. The main changes with respect to the previous edition are as follows: the title has been shortened and simplified to read "Weibull analysis"; and provision of methods for both analytical and graphical solutions have been added.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61649
Publication Date Aug. 1, 2008
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 56
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