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IEC 61650 Ed. 1.0 b:1997

Reliability data analysis techniques - Procedures for comparison of two constant failure rates and two constant failure (event) intensities
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IEC 61650 Ed. 1.0 b:1997

Reliability data analysis techniques - Procedures for comparison of two constant failure rates and two constant failure (event) intensities

PUBLISH DATE 2026
PAGES 48
IEC 61650 Ed. 1.0 b:1997
Reliability data analysis techniques - Procedures for comparison of two constant failure rates and two constant failure (event) intensities
Specifies procedures to compare two observed - failure rates; - failure intensities; - rates/intensities of relevant events. The procedures are used to determine whether an apparent difference between the two sets of observations can be considered statistically significant. Numerical methods and a graphical procedure are prescribed. Simple practical examples are provided to illustrate how the procedures can be applied.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61650
Publication Date April 1, 2026
Language b - English & French
Page Count 48
Revision Level 1.0
Supercedes
Committee 56
Publish Date Document Id Type View
April 1, 2026 IEC 61650 Ed. 1.0 b:1997 Revision
Aug. 1, 1997 Revision