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IEC 61671-6 Ed. 1.0 en:2016

Standard for automatic test markup language (ATML) test station description
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IEC 61671-6 Ed. 1.0 en:2016

Standard for automatic test markup language (ATML) test station description

PUBLISH DATE 2016
PAGES 38
IEC 61671-6 Ed. 1.0 en:2016

Standard for Automatic Test Markup Language (ATML) Test Station Description

This standard defines the schema and requirements for describing test stations using Automatic Test Markup Language (ATML).

It specifies how to represent the hardware and software components, capabilities, and configurations of test stations to enable automated test program development and management.

The document aims to promote interoperability and data exchange between test systems and test management tools by standardizing the test station descriptions.

IEC 61671-6:2016(E) defines an exchange format, utilizing eXtensible Markup Language (XML), for both the static description of a test station, and the specific description of test station instance information.

SDO IEC: International Electrotechnical Commission
Document Number IEC 61671
Publication Date April 1, 2016
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 91
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