Logo
Login Sign Up
Current Revision

IEC 61671 Ed. 1.0 en:2012

Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
Best Price Guarantee
Instant

$599.83

2-5 Days

$599.83

SAVE 10%

$1,079.69


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC 61671 Ed. 1.0 en:2012

Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

PUBLISH DATE 2012
PAGES 394
IEC 61671 Ed. 1.0 en:2012

Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

IEC 61671:2012(E) defines a standard exchange medium for sharing information between components of ATSs.

This information includes test data, resource data, diagnostic data, and historic data.

The exchange medium is defined using XML.

This standard specifies the framework for the family of ATML standards.

SDO IEC: International Electrotechnical Commission
Document Number IEC 61671
Publication Date June 21, 2012
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 91
Loading...

Failed to load document history.

Publish Date Document Id Type View