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IEC 61967-8 Ed. 2.0 b:2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
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IEC 61967-8 Ed. 2.0 b:2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

PUBLISH DATE 2023
PAGES 56
IEC 61967-8 Ed. 2.0 b:2023

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

IEC 61967-8:2023 is available as IEC 61967-8:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.

IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.

This edition includes the following significant technical changes with respect to the previous edition:

  • a) frequency range of 150 kHz to 3 GHz was deleted from the scope;
  • b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.
SDO IEC: International Electrotechnical Commission
Document Number IEC 61967
Publication Date May 1, 2023
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 47A
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