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IEC 62047-4 Ed. 2.0 en:2026

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
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IEC 62047-4 Ed. 2.0 en:2026

Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS

IEC 62047-4 Ed. 2.0 en:2026

IEC 62047-4:2026 describes generic specifications for micro-electromechanical systems (MEMS) made by semiconductors, which are the basis for specifications given in other parts of this series for various types of MEMS applications such as sensors, RF MEMS, optical MEMS, bio-MEMS, micro TAS, and power MEMS.

This document specifies general procedures for quality assessment and establishes general principles for describing and testing of electrical, optical, mechanical and environmental characteristics.

This part of IEC 62047 aids in the preparation of standards that define devices and systems made by micromachining technology, including but not limited to, material characterization and handling, assembly and testing, process control and measuring methods.

MEMS described in this document are basically made of semiconductor material. However, the statements made in this document are also applicable to MEMS using materials other than semiconductor, for example, polymers, glass, metals and ceramic materials.

This edition includes the following significant technical changes with respect to the previous edition:

  • a) in the Scope, optical MEMS, bio-MEMS, micro TAS, and power MEMS for various types of MEMS applications were included;
  • b) MEMS categories and terms in Table 1 were slightly modified such consumer electronics and automotive were added that in application technology.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62047
Publication Date Not Available
Language en - English
Page Count 24
Revision Level 2.0
Supercedes
Committee 47F
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