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IEC 62047-40 Ed. 1.0 en:2021

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
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IEC 62047-40 Ed. 1.0 en:2021

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

PUBLISH DATE 2021
PAGES 16
IEC 62047-40 Ed. 1.0 en:2021

Semiconductor devices - Micro-electromechanical devices - Part 40: Test methods of micro-electromechanical inertial shock switch threshold

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold.

This document applies to normally open micro-electromechanical inertial shock switch.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62047
Publication Date Sept. 1, 2021
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 47F
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