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IEC 62047-50 Ed. 1.0 en:2025

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
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IEC 62047-50 Ed. 1.0 en:2025

Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones

IEC 62047-50 Ed. 1.0 en:2025

IEC 62047-50:2025 defines the test conditions and test methods for the performance of MEMS capacitive microphones.

This document applies to MEMS capacitive microphones.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62047
Publication Date Not Available
Language en - English
Page Count 18
Revision Level 1.0
Supercedes
Committee 47F
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