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IEC 62047-7 Ed. 1.0 b:2011

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection
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IEC 62047-7 Ed. 1.0 b:2011

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

PUBLISH DATE 2011
PAGES 60
IEC 62047-7 Ed. 1.0 b:2011

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices.

This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.

SDO IEC: International Electrotechnical Commission
Document Number IEC 62047
Publication Date June 1, 2011
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47F
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