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IEC 62132-1 Ed. 2.0 b:2015

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
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IEC 62132-1 Ed. 2.0 b:2015

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

PUBLISH DATE 2015
PAGES 54
IEC 62132-1 Ed. 2.0 b:2015
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 62132-1:2015 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s). This edition includes the following significant technical changes with respect to the previous edition:
a) frequency range of 150 kHz to 1 GHz has been deleted from the title;
b) frequency step above 1 GHz has been added in Table 2 in 7.4.1;
c) IC performance classes in 8.3 have been modified;
d) Table A.1 was divided into two tables, and references to IEC 62132-8 and IEC 62132-9 have been added in the new Table A.2 in Annex A.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62132
Publication Date Oct. 1, 2015
Language b - English & French
Page Count
Revision Level 2.0
Supercedes
Committee 47A
Publish Date Document Id Type View
Oct. 1, 2015 Revision
Oct. 1, 2015 IEC 62132-1 Ed. 2.0 b:2015 Revision