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IEC 62215-3 Ed. 1.0 b:2013

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
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IEC 62215-3 Ed. 1.0 b:2013

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

PUBLISH DATE 2013
PAGES 70
IEC 62215-3 Ed. 1.0 b:2013
Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
IEC 62215-3:2013 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily synchronized to the operation of the device under test (DUT), are applied to the IC pins via coupling networks. This method enables understanding and classification of interaction between conducted transient disturbances and performance degradation induced in ICs regardless of transients within or beyond the specified operating voltage range.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62215
Publication Date July 1, 2013
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47A
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