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IEC 62415 Ed. 1.0 b:2010

Semiconductor devices - Constant current electromigration test
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IEC 62415 Ed. 1.0 b:2010

Semiconductor devices - Constant current electromigration test

PUBLISH DATE 2010
PAGES 26
IEC 62415 Ed. 1.0 b:2010
Semiconductor devices - Constant current electromigration test
IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62415
Publication Date May 1, 2010
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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