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IEC 62429 Ed. 1.0 b:2007

Reliability growth - Stress testing for early failures in unique complex systems
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IEC 62429 Ed. 1.0 b:2007

Reliability growth - Stress testing for early failures in unique complex systems

PUBLISH DATE 2007
PAGES 76
IEC 62429 Ed. 1.0 b:2007
Reliability growth - Stress testing for early failures in unique complex systems
This International Standard gives guidance for reliability growth during final testing or acceptance testing of unique complex systems. It gives guidance on accelerated test conditions and criteria for stopping these tests.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62429
Publication Date Nov. 1, 2007
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 56
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