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IEC 62527 Ed. 1.0 en:2007

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
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IEC 62527 Ed. 1.0 en:2007

Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification

PUBLISH DATE 2007
PAGES 44
IEC 62527 Ed. 1.0 en:2007
Standard for Extensions to Standard Test Interface Language (STIL) for DC Level Specification
STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62527
Publication Date Nov. 1, 2007
Language en - English
Page Count 44
Revision Level 1.0
Supercedes
Committee 91
Publish Date Document Id Type View
Nov. 1, 2007 Revision
Nov. 1, 2007 IEC 62527 Ed. 1.0 en:2007 Revision