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IEC 62528 Ed. 1.0 en:2007

Standard Testability Method for Embedded Core-based Integrated Circuits
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IEC 62528 Ed. 1.0 en:2007

Standard Testability Method for Embedded Core-based Integrated Circuits

PUBLISH DATE 2007
PAGES 130
IEC 62528 Ed. 1.0 en:2007
Standard Testability Method for Embedded Core-based Integrated Circuits
Defines a mechanism for the test of core designs within a system on chip (SoC).This mechanism constitutes a hardware architecture and leverages the core test language (CTL)to faciliate communication between core designers and core integrators.
SDO IEC: International Electrotechnical Commission
Document Number IEC 62528
Publication Date Nov. 1, 2007
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 91
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