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IEC 62860 Ed. 1.0 en:2013

Test methods for the characterization of organic transistors and materials
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IEC 62860 Ed. 1.0 en:2013

Test methods for the characterization of organic transistors and materials

PUBLISH DATE 2013
PAGES 28
IEC 62860 Ed. 1.0 en:2013
Test methods for the characterization of organic transistors and materials
IEC 62860:2013(E) covers recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors. Due to the nature of printed and organic electronics, significant measurement errors can be introduced if the electrical characterization design-of-experiment is not properly addressed. This standard describes the most common sources of measurement error, particularly for high-impedance electrical measurements commonly required for printed and organic transistors. This standard also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic transistors. Keywords: electrical characterization, FET, flexible electronics, high impedance, nanocomposite, nanotechnology, OFET, organic electronics, organic transistor, printed electronics, printing, transistor
SDO IEC: International Electrotechnical Commission
Document Number IEC 62860
Publication Date Aug. 1, 2013
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 113
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