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IEC 63202-1 Ed. 1.0 b:2019

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
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IEC 63202-1 Ed. 1.0 b:2019

Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells

PUBLISH DATE 2019
PAGES 22
IEC 63202-1 Ed. 1.0 b:2019
Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
SDO IEC: International Electrotechnical Commission
Document Number IEC 63202
Publication Date June 1, 2019
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 82
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