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IEC 63287-2 Ed. 1.0 b:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
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IEC 63287-2 Ed. 1.0 b:2023

Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile

PUBLISH DATE 2023
PAGES 34
IEC 63287-2 Ed. 1.0 b:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
IEC 63287-2:2023 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
SDO IEC: International Electrotechnical Commission
Document Number IEC 63287
Publication Date March 1, 2023
Language b - English & French
Page Count
Revision Level 1.0
Supercedes
Committee 47
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