IEC 63364-1 Ed. 1.0 b:2022

Current Revision
Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

Best Price Guarantee Dec 1, 2022 EN/FR 28 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
International Electrotechnical Commission Logo

Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection

PUBLISH DATE 2022
PAGES 28

Semiconductor devices - Semiconductor devices for IoT system - Part 1:

Test method of sound variation detection

IEC 63364-1:2022 specifies terms, the test method, and the report of sound variation detection system based on IoT.

It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions.

In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.

Loading...

Failed to load document history.

Publish Date Document Id Type View