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IEC/TS 62804-1
Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1: Crystalline silicon
IEC/TS 62804-1 Ed. 2.0 en:2025

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1: Crystalline silicon

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IEC/TS 62804-1-1
Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1-1: Crystalline silicon - Delamination
IEC/TS 62804-1-1 Ed. 1.0 en:2020

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1-1: Crystalline silicon - Delamination

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IEC/TS 62804-2
Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film
IEC/TS 62804-2 Ed. 1.0 en:2022

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film

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IEC/TS 62818-1
Conductors for overhead lines - Fiber reinforced composite core used as supporting member material - Part 1: Polymeric matrix composite cores
IEC/TS 62818-1 Ed. 1.0 en:2024

Conductors for overhead lines - Fiber reinforced composite core used as supporting member material - Part 1: Polymeric matrix composite cores

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IEC/TS 62818-2
Conductors for overhead lines - Fiber reinforced composite core used as supporting member material - Part 2: Metallic matrix composite cores
IEC/TS 62818-2 Ed. 1.0 en:2024

Conductors for overhead lines - Fiber reinforced composite core used as supporting member material - Part 2: Metallic matrix composite cores

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IEC/TS 62835
Electric toasters for household and similar use - Methods and measurements for improving accessibility
IEC/TS 62835 Ed. 1.0 en:2015

Electric toasters for household and similar use - Methods and measurements for improving accessibility

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IEC/TS 62836
Measurement of internal electric field in insulating materials - Pressure wave propagation method
IEC/TS 62836 Ed. 1.0 en:2020

Measurement of internal electric field in insulating materials - Pressure wave propagation method

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IEC/TS 62840-1
Electric vehicle battery swap system - Part 1: General and guidance
IEC/TS 62840-1 Ed. 1.0 en:2016

Electric vehicle battery swap system - Part 1: General and guidance

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IEC/TS 62844
Guidelines for quality and risk assessment for nano-enabled electrotechnical products
IEC/TS 62844 Ed. 1.0 en:2016

Guidelines for quality and risk assessment for nano-enabled electrotechnical products

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IEC/TS 62861
Guidelines for principal component reliability testing for LED light sources and LED luminaires
IEC/TS 62861 Ed. 1.0 en:2017

Guidelines for principal component reliability testing for LED light sources and LED luminaires

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IEC/TS 62862-1-1
Solar thermal electric plants - Part 1-1: Terminology
IEC/TS 62862-1-1 Ed. 1.0 en:2018

Solar thermal electric plants - Part 1-1: Terminology

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IEC/TS 62862-1-2
Solar thermal electric plants - Part 1-2: General - Creation of annual solar radiation data set for solar thermal electric (STE) plant simulation
IEC/TS 62862-1-2 Ed. 1.0 en:2017

Solar thermal electric plants - Part 1-2: General - Creation of annual solar radiation data set for solar thermal electric (STE) plant simulation

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IEC/TS 62862-1-3
Solar thermal electric plants - Part 1-3: General - Data format for meteorological data sets
IEC/TS 62862-1-3 Ed. 1.0 en:2017

Solar thermal electric plants - Part 1-3: General - Data format for meteorological data sets

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IEC/TS 62862-2-1
Solar thermal electric plants - Part 2-1: Thermal energy storage systems - Characterization of active, sensible systems for direct and indirect configurations
IEC/TS 62862-2-1 Ed. 1.0 en:2021

Solar thermal electric plants - Part 2-1: Thermal energy storage systems - Characterization of active, sensible systems for direct and indirect configurations

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IEC/TS 62862-3-3
Solar thermal electric plants - Part 3-3: Systems and components - General requirements and test methods for solar receivers
IEC/TS 62862-3-3 Ed. 1.0 en:2020

Solar thermal electric plants - Part 3-3: Systems and components - General requirements and test methods for solar receivers

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IEC/TS 62871-1
Professional video strage products - Tape-less camera recorder using MXF file format - Encoding guidelines - Part 1: MXF Operational Pattern
IEC/TS 62871-1 Ed. 1.0 en:2015

Professional video strage products - Tape-less camera recorder using MXF file format - Encoding guidelines - Part 1: MXF Operational Pattern

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IEC/TS 62871-2
Professional video storage products - Tape-less camera recorder using MXF file format - Encoding guidelines - Part 2: Mapping MPEG-2 and AVC Streams into MXF
IEC/TS 62871-2 Ed. 1.0 en:2019

Professional video storage products - Tape-less camera recorder using MXF file format - Encoding guidelines - Part 2: Mapping MPEG-2 and AVC Streams into MXF

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IEC/TS 62872-1
Industrial-process measurement, control and automation - Part 1: System interface between industrial facilities and the smart grid
IEC/TS 62872-1 Ed. 1.0 en:2019

Industrial-process measurement, control and automation - Part 1: System interface between industrial facilities and the smart grid

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IEC/TS 62876-2-1
Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test
IEC/TS 62876-2-1 Ed. 1.0 en:2018

Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test

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IEC/TS 62876-3-1
Nanomanufacturing - Reliability assessment - Part 3-1: Graphene-based material - Stability: Temperature and humidity test
IEC/TS 62876-3-1 Ed. 1.0 en:2022

Nanomanufacturing - Reliability assessment - Part 3-1: Graphene-based material - Stability: Temperature and humidity test

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IEC/TS 62876-3-2
Nanomanufacturing - Reliability and durability assessment - Part 3-2: Graphene - Ellipsometry measurement of graphene
IEC/TS 62876-3-2 Ed. 1.0 en:2026

Nanomanufacturing - Reliability and durability assessment - Part 3-2: Graphene - Ellipsometry measurement of graphene

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IEC/TS 62876-3-4
Nanomanufacturing - Reliability assessment - Part 3-4: Linearity of output characteristics for metal contacted 2D semiconductor devices
IEC/TS 62876-3-4 Ed. 1.0 en:2025

Nanomanufacturing - Reliability assessment - Part 3-4: Linearity of output characteristics for metal contacted 2D semiconductor devices

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IEC/TS 62876-4-1 PDF Preview
IEC/TS 62876-4-1 Ed. 1.0 en:2025

Nanomanufacturing – Reliability assessment – Part 4-1: Nanophotonic products – Optical stability test of quantum dot enabled light conversion films: Temperature, humidity and light exposure

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IEC/TS 62878-2-1
Device embedded substrate - Part 2-1: Guidelines - General description of technology
IEC/TS 62878-2-1 Ed. 1.0 b:2015

Device embedded substrate - Part 2-1: Guidelines - General description of technology

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IEC/TS 62878-2-10
Device embedding assembly technology - Part 2-10: Design specification for cavity substrate
IEC/TS 62878-2-10 Ed. 1.0 en:2024

Device embedding assembly technology - Part 2-10: Design specification for cavity substrate

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