IEC/TR 63133 Ed. 1.0 en:2017

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Semiconductor devices - Scan based ageing level estimation for semiconductor devices

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Semiconductor devices - Scan based ageing level estimation for semiconductor devices

PUBLISH DATE 2017

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level.

The estimated ageing level can be used to improve the reliability of system.

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