Logo
Login Sign Up
Current Revision

IEC/TS 62607-6-11 Ed. 1.0 en:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy
Best Price Guarantee

$264.88

2-5 Days

$264.88

SAVE 10%

$476.78


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
International Electrotechnical Commission Logo

IEC/TS 62607-6-11 Ed. 1.0 en:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

PUBLISH DATE 2022
IEC/TS 62607-6-11 Ed. 1.0 en:2022

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene - Defect density: Raman spectroscopy

IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic defect density nD of graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by Raman spectroscopy.

SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 62607
Publication Date Feb. 1, 2022
Language en - English
Page Count
Revision Level 1.0
Supercedes
Committee 113
Loading...

Failed to load document history.

Publish Date Document Id Type View