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IEC/TS 62876-3-2 Ed. 1.0 en:2026

Nanomanufacturing - Reliability and durability assessment - Part 3-2: Graphene - Ellipsometry measurement of graphene
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IEC/TS 62876-3-2 Ed. 1.0 en:2026

Nanomanufacturing - Reliability and durability assessment - Part 3-2: Graphene - Ellipsometry measurement of graphene

PUBLISH DATE 2026
IEC/TS 62876-3-2 Ed. 1.0 en:2026

IEC TS 62876-3-2:2026, which is a Technical Specification, establishes a standardized method to determine volume fraction for graphene by ellipsometry.

Thickness/composition measurements are evaluated by ellipsometry before and after the stability test. By model calculation, the volume fraction of graphene can be evaluated. Since the test method is non destructive, it can be used to assess the reliability and durability of graphene films on production lines.

  • For graphene-capped copper for Cu interconnects in semiconductor engineering, for example, the reliability and durability of the capping layer are evaluated.
  • Gas sensors, gas barriers, transparent electrodes for solar cells, etc. are being researched and developed.

This method is useful for non-destructive and quantitative evaluation of the volume fraction of graphene to assess the reliability and durability.

SDO IEC: International Electrotechnical Commission
Document Number IEC/TS 62876
Publication Date April 1, 2026
Language en - English
Page Count 22
Revision Level 1.0
Supercedes
Committee 113
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