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IEEE 1671.5-2008

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information
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IEEE 1671.5-2008

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

PUBLISH DATE 2012
PAGES 31
IEEE 1671.5-2008

New IEEE Standard - Superseded.

An exchange format, utilizing XML, for identifying all of the hardware, software, and documentation associated with a test station is specified in this document.

This test station may be used as a component of a test program set to test and diagnose a unit under test.

The scope of this trial-use standard is the definition of an exchange format, utilizing XML, for exchanging the test adapter information by defining the interface between the UUT and the test station.

This includes the description of the test adapter (e.g., physical and electrical characteristics, capabilities/performance, and identification/classification).

The purpose of this standard is to provide a standardized format to promote and facilitate interoperability between components of non-manual test systems, by allowing the exchange of test adapter information. The test adapter schema becomes a class of information that can be used within the ATML family of standards.

Each instance document contains the definition of a single test adapter model. The test adapter schema provides a structure for describing test adapter capabilities and structure.

This standard will allow test adapter information to be transportable across a variety of automatic test equipment (ATE) within the automotive, semiconductor, aerospace, and military industries.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 1671.5
Publication Date Feb. 1, 2012
Language en - English
Page Count 27
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
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