Logo
Login Sign Up
Current Revision

IEEE/IEC 61671-5-2016

IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description
Best Price Guarantee
Instant

$71.00

2-5 Days

$86.00

SAVE 10%

$141.30


Sub Total (1 Item(s))

$ 0.00

Estimated Shipping

$ 0.00

Total (Pre-Tax)

$ 0.00


View in Library
or
Institute of Electrical and Electronics Engineers Logo

IEEE/IEC 61671-5-2016

IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description

PUBLISH DATE 2016
PAGES 32
IEEE/IEC 61671-5-2016

Adoption Standard - Active.

An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document.

This test adapter may be used as a component of a test program set to test and diagnose a unit under test.

This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number 61671-5
Publication Date April 8, 2016
Language en - English
Page Count 32
Revision Level
Supercedes
Committee SCC20 - Test and Diagnosis for Electronic Systems
Loading...

Failed to load document history.

Publish Date Document Id Type View