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IEEE Test Procedure for Semiconductor Diodes
Inactive-Withdrawn.
This Standard recommends and describes methods of measurement of the important electrical characteristics of semiconductor diodes.
For the purpose of this Standard, a semiconductor diode is defined1 as: A semiconductor device having two terminals and exhibiting a nonlinear voltage--current characteristic; in more restricted usage, a semiconductor device which has the asymmetrical voltage--current characteristic exemplified by a single p-n junction.
Methods of test are described for static, small-signal and pulse parameters.
Many of the terms considered herein have been set down in AIEE and IRE Standards, particularly in 60 IRE 28.SH and AIEE No. 4252.
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