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IEEE/ANSI C63.24-2021

American National Standard - Recommended Practice for In Situ RF Immunity Evaluation of Electronic Devices and Systems
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IEEE/ANSI C63.24-2021

American National Standard - Recommended Practice for In Situ RF Immunity Evaluation of Electronic Devices and Systems

PUBLISH DATE 2021
PAGES 30
IEEE/ANSI C63.24-2021

New IEEE Standard - Active.

This document provides recommended test methods for assuring the radio frequency (RF) immunity of electronic devices and systems that might experience susceptibility from general use transceivers or the RF ambient.

This recommended practice provides a method for in situ immunity testing of electronic devices and systems that are installed and operated at the locations where they are used, as well as where they experience interference.

The primary source of the electromagnetic (EM) energy is from transmitters that are authorized to be used, as they are in compliance with regulatory requirements. Another source is the general ambient EM environment from a variety of sources. The ambient EM environment can be characterized via a site survey using the techniques found in IEEE Std 473.

In laboratory testing, the product is exposed to RF energy (conducted or radiated) over a wide frequency range. This cannot be done at the in situ location without a special license from regulators (e.g., the FCC). Hence, it is expected that transceivers with known frequencies allowed by the regulatory authorities are used during testing, such as licensed devices or devices using industrial, scientific, and medical (ISM) frequency bands.

This is intended to replicate the immunity experience on-site where these devices/sources have been known already to be the cause of interference.

NOTE--For interference in healthcare facilities, see ANSI C63.18 [B2].

There is a need to evaluate the in situ radio-frequency (RF) immunity of electronic devices and systems. This recommended practice focuses on installation environments that have experienced interference when exposed to portable or ambient RF sources.

System aging is another reason for in situ testing. A number of aging mechanisms can degrade the initial immunity of installed equipment over its operational life. Periodic in situ testing can help verify that the required level of immunity continues to be in place over the operating life of a system.

In particular, if interference is exhibited suddenly, the equipment immunity should be re-evaluated using the most recent portable RF devices and the most recent RF ambient at the location where the product is installed.

SDO IEEE: Institute of Electrical and Electronics Engineers
Document Number C63.24
Publication Date March 31, 2021
Language en - English
Page Count 30
Revision Level
Supercedes
Committee
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