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IEC 62526 Ed. 1 (IEEE Std 1450.1(TM)-2005): Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
New IEEE Standard - Active.
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment.
Extensions to the test interface language (contained in this standard) are defined that:
Structures are defined in STIL to support usage as semiconductor simulation stimulus, including:
Structures are defined in STIL to support the definition of test patterns for sub-blocks of a design (i.e., embedded cores) such that these tests can be incorporated into a complete higher level device test.
Structures are defined in STIL to relate fail information from device testing environments back to original stimulus and design data elements.
Syntax in this document that is used in the definition of patterns for sub-blocks is summarized in Annex O.
The STIL language definition is enhanced to support the usage of STIL in the design environment, which includes extending the execution concept to support STIL as a stimulus language, to allow STIL to be used as an intermediate form of data, and to allow STIL to capture design information needed to port simulation data to device test environments.
In addition, define extensions to support the definition of subelement tests and to define the mechanisms to integrate those tests into a complete device test. This effort is to be performed in conjunction with IEEE Std 1500TM-2005 [B6] and IEEE P1450.6 [B5], which are defining standards for the definition and integration of embedded cores.
Finally, define the constructs necessary to correlate test failure information back to the design environment, to allow debug and diagnosis operations to be performed based on failure information in STIL format.
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