IPC/JEDEC-J-STD-035A

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Acoustic Microscopy for Nonhermetic Encapsulated Electronics Devices

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IPC/JEDEC-J-STD-035A

Acoustic Microscopy for Nonhermetic Encapsulated Electronics Devices

PUBLISH DATE 2022
IPC/JEDEC-J-STD-035A
Acoustic Microscopy for Nonhermetic Encapsulated Electronics Devices
IPC/JEDEC J-STD-035A test method defines the procedures for performing acoustic microscopy on nonhermetic encapsulated electronic devices. IPC/JEDEC J-STD-035A method provides users with an acoustic microscopy process flow for detecting anomalies (delaminations, cracks, mold compound voids, etc.) nondestructively in encapsulated electronic devices while achieving reproducibility
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