ISO 14975:2000

Current Revision
Surface chemical analysis -- Information formats

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ISO 14975:2000

Surface chemical analysis -- Information formats

PUBLISH DATE 2000
ISO 14975:2000

This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion and revision of a surface chemical analysis spectral database.

The format is applied to Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.

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