ISO 15625:2014

Current Revision
Silk - Electronic test method for defects and evenness of raw silk

Best Price Guarantee May 1, 2014 English 1 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00
View in Library
or
International Organization for Standardization Logo

ISO 15625:2014

Silk - Electronic test method for defects and evenness of raw silk

PUBLISH DATE 2014
ISO 15625:2014

ISO 15625:2014 specifies a test method for defects and evenness of raw silk by capacitive and optical electronic testers.

It is applicable to raw silk with the yarn size between 13,3 dtex and 76,7 dtex or 12 denier and 69 denier, whether in skein or on cone, soaked or unsoaked.

Loading...

Failed to load document history.

Publish Date Document Id Type View