ISO 16243:2011

Current Revision
Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

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ISO 16243:2011

Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

PUBLISH DATE 2011
ISO 16243:2011

ISO 16243:2011 specifies the minimum level of information to be reported by the analyst following the analysis of a test specimen using X‑ray photoelectron spectroscopy (XPS).

It includes information that is to be recorded on or in the analytical record.

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