ISO 17297:2025

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Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary

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ISO 17297:2025

Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary

PUBLISH DATE 2025
ISO 17297:2025

This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).

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