ISO 17901-2:2015

Current Revision
Optics and photonics - Holography - Part 2: Methods for measurement of hologram recording characteristics

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ISO 17901-2:2015

Optics and photonics - Holography - Part 2: Methods for measurement of hologram recording characteristics

PUBLISH DATE 2015
ISO 17901-2:2015

ISO 17901-2:2015 specifies the terms and measurement method concerning exposure characteristics (exposure characteristic curve, exposure at half-maximum, R-value, amplitude of refractive index modulation) for the hologram recorded by double-beam interference.

The materials of hologram to be measured are not restricted to any particular ones.

ISO 17901-2:2015 does not intend to restrict manufacturing process.

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