ISO 18452:2005

Current Revision
Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

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ISO 18452:2005

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer

PUBLISH DATE 2005
ISO 18452:2005

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer.

The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

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