ISO 23699:2026

Current Revision
Microbeam analysis - Electron backscatter diffraction - Vocabulary

Best Price Guarantee Sep 1, 2026 English 20 Pages

Sub Total (1 Item(s)) $ 0.00
Estimated Shipping $ 0.00
Total (Pre-Tax) $ 0.00

You own the digital copy of this edition

View in Library
or
International Organization for Standardization Logo

ISO 23699:2026

Microbeam analysis - Electron backscatter diffraction - Vocabulary

PUBLISH DATE 2026
ISO 23699:2026

This document defines terms used for the electron backscatter diffraction (EBSD) technique. This document covers both general and specific concepts classified according to their hierarchy in a systematic order.

This document is applicable to standardization documents relevant to EBSD practices.

In addition, some definitions in this document are applicable to transmission Kikuchi diffraction (TKD).

Loading...

Failed to load document history.

Publish Date Document Id Type View