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Surface chemical analysis - Atomic force microscopy - Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
This document describes a procedure for the quantitative characterization of the probe tip of an atomic force microscope (AFM) probe and a restoration of AFM topography images dilated by finite probe size.
The three-dimensional shape of the probe apex is extracted by image reconstruction using suitable reference materials.
This document is applicable to the reconstruction of AFM topography images of solid material surfaces.
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