ISO 6342:2003

Current Revision
Micrographics - Aperture cards - Method of measuring thickness of buildup area

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ISO 6342:2003

Micrographics - Aperture cards - Method of measuring thickness of buildup area

PUBLISH DATE 2003
ISO 6342:2003

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

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