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JEDEC JESD47M

Stress-Test-Driven Qualification of Integrated Circuits
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JEDEC JESD47M

Stress-Test-Driven Qualification of Integrated Circuits

PUBLISH DATE 2025
JEDEC JESD47M
This standard describes a baseline set of acceptance tests for use in qualifying electronic devices as new products, a product family, or as products in a process which is being changed. A list of RAND License Assurance/Disclosure Forms is available to JEDEC members on the restricted Members' website. Non-members may obtain individual Assurance/Disclosure forms by requesting them from the JEDEC office.
SDO JEDEC: LEGACY IMPORT
Document Number JEDEC JESD 47
Publication Date Aug. 1, 2025
Language en - English
Page Count
Revision Level M
Supercedes
Committee
Publish Date Document Id Type View
Aug. 1, 2025 JESD47M Revision
Dec. 1, 2022 JEDEC JESD 47L Revision