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JEDEC JESD22-A101D.01

STEADY-STATE TEMPERATURE-HUMIDITY BIAS LIFE TEST
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JEDEC JESD22-A101D.01

STEADY-STATE TEMPERATURE-HUMIDITY BIAS LIFE TEST

PUBLISH DATE 2021
JEDEC JESD22-A101D.01
This standard establishes a defined method and conditions for performing a temperature-humidity life test with bias applied. The test is used to evaluate the reliability of nonhermetic packaged solid state devices in humid environments. It employs high temperature and humidity conditions to accelerate the penetration of moisture through external protective material or along interfaces between the external protective coating and conductors or other features that pass through it. This revision enhances the ability to perform this test on a device which cannot be biased to achieve very low power dissipation.
SDO JEDEC: LEGACY IMPORT
Document Number
Publication Date Jan. 1, 2021
Language en - English
Page Count
Revision Level D.01
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