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JEDEC JESD22-A108G

TEMPERATURE, BIAS, AND OPERATING LIFE
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JEDEC JESD22-A108G

TEMPERATURE, BIAS, AND OPERATING LIFE

PUBLISH DATE 2022
JEDEC JESD22-A108G
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this document.
SDO JEDEC: LEGACY IMPORT
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Publication Date Nov. 1, 2022
Language en - English
Page Count
Revision Level G
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