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JIS K 0122:1997
General rules for ion selective electrode method
JIS K 0122:1997

General rules for ion selective electrode method

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JIS K 0124:2011
General rules for high performance liquid chromatography
JIS K 0124:2011

General rules for high performance liquid chromatography

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JIS K 0125:2016
Testing methods for volatile organic compounds in industrial water and waste water
JIS K 0125:2016

Testing methods for volatile organic compounds in industrial water and waste water

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JIS K 0126:2019
General rules for flow analysis
JIS K 0126:2019

General rules for flow analysis

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JIS K 0127:2013
General rules for ion chromatography
JIS K 0127:2013

General rules for ion chromatography

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JIS K 0128:2000
Testing methods for pesticides in industrial water and waste water
JIS K 0128:2000

Testing methods for pesticides in industrial water and waste water

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JIS K 0129:2005
General rules for thermal analysis
JIS K 0129:2005

General rules for thermal analysis

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JIS K 0130:2008
General rules for electrical conductivity measuring method
JIS K 0130:2008

General rules for electrical conductivity measuring method

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JIS K 0131:1996
General rules for X-ray diffractometric analysis
JIS K 0131:1996

General rules for X-ray diffractometric analysis

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JIS K 0132:1997
General rules for scanning electron microscopy
JIS K 0132:1997

General rules for scanning electron microscopy

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JIS K 0133:2022
General rules for ICP-mass spectrometry
JIS K 0133:2022

General rules for ICP-mass spectrometry

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JIS K 0134:2002
General rules for near-infrared spectrophotometric analysis
JIS K 0134:2002

General rules for near-infrared spectrophotometric analysis

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JIS K 0135:2003
General rules for preparative liquid chromatography
JIS K 0135:2003

General rules for preparative liquid chromatography

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JIS K 0137:2010
General rules for Raman spectrometry
JIS K 0137:2010

General rules for Raman spectrometry

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JIS K 0138:2018
General rules for quantitative nuclear magnetic resonance spectroscopy
JIS K 0138:2018

General rules for quantitative nuclear magnetic resonance spectroscopy

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JIS K 0148:2005
Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
JIS K 0148:2005

Surface chemical analysis -- Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy

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JIS K 0151:1983
Non-dispersive infrared gas analyzer
JIS K 0151:1983

Non-dispersive infrared gas analyzer

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JIS K 0222:2022
Methods for determination of mercury in stack gas
JIS K 0222:2022

Methods for determination of mercury in stack gas

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JIS K 0225:2002
Testing methods for determination of trace components in diluent gas and zero gas
JIS K 0225:2002

Testing methods for determination of trace components in diluent gas and zero gas

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JIS K 0229:1992
Testing methods for determination of the inhibition of the mobility of Daphnia by chemicals
JIS K 0229:1992

Testing methods for determination of the inhibition of the mobility of Daphnia by chemicals

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JIS K 0301:2016
Methods for determination of oxygen in flue gas
JIS K 0301:2016

Methods for determination of oxygen in flue gas

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JIS K 0302:1989
Measuring method for particle-size distribution of dusts in flue gas
JIS K 0302:1989

Measuring method for particle-size distribution of dusts in flue gas

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JIS K 0304:1996
Methods for determination of carbon dioxide in air
JIS K 0304:1996

Methods for determination of carbon dioxide in air

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JIS K 0305:1997
Methods for determination of trichloroethylene and tetrachloroethylene in flue gas
JIS K 0305:1997

Methods for determination of trichloroethylene and tetrachloroethylene in flue gas

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JIS K 0306:2004
Measuring method for volatile organic compounds in airbor?e by gas detector tube
JIS K 0306:2004

Measuring method for volatile organic compounds in airbor?e by gas detector tube

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